Delivering Innovative Solutions for Thin Film Measurements
4th Gen. Ellipsometers
The 4th generation Film Sense Multi-Wavelength Ellipsometer systems are now available, with more wavelengths and wider spectral range!
Ellipsometric data analysis can be difficult, especially for new users. Model Builder is a revolutionary new feature to automate the building and testing of analysis models.
Ellipsometric measurements in air and liquid ambients are combined to provide more information and enhanced sensitivity for thin film characterization
Automated alignment stages for in situ ellipsometry
Ultra-fast dynamic ellipsometric measurements with excellent thickness precision